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Hitachi High-Technologies (Electron Microscopy)
Address: UK
Telephone: (UK) +44 118 932 8632
http://www.hsi-europe.com
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Listing of all 28 news releases from Hitachi High-Technologies (Electron Microscopy):
Electron microscope has resolution for research
Ultra-high-resolution scanning transmission electron microscope is characterised by new electron optics which now include a spherical aberration correction system.
News from Hitachi High-Technologies (Electron Microscopy) (10 January 2007)
TM-1000 on show at Buckingham Palace
Two of Hitachi's TM-1000 tabletop microscopes were on display as part of the Natural History Museum's contribution to a special science exhibition held at Buckingham Palace on 24 October 2006.
News from Hitachi High-Technologies (Electron Microscopy) ( 4 December 2006)
Electron optics experts head for Japan
Representatives from the Hitachi organisation throughout the world will be making a significant contribution to the 16th International Microscopy Congress in Japan next month.
News from Hitachi High-Technologies (Electron Microscopy) (17 August 2006)
Large chamber analytical VPSEM launched
Hitachi High-Technologies has announced the launch of the S-3700N variable pressure scanning electron microscope (VPSEM).
News from Hitachi High-Technologies (Electron Microscopy) (14 July 2006)
Tabletop microscope takes a different view
A new tabletop microscope has the potential to transform the field of basic microscopy.
News from Hitachi High-Technologies (Electron Microscopy) (10 April 2006)
Allen expands scope network
Hitachi High-Technologies has announced a major expansion in sales territories for its electron microscopes.
News from Hitachi High-Technologies (Electron Microscopy) (20 March 2006)
Detector provides a powerful alternative
Hitachi High-Technologies has introduced a new environmental secondary electron detector (ESED) for the S-3400N variable pressure scanning electron microscope.
News from Hitachi High-Technologies (Electron Microscopy) (15 November 2005)
Heated holder aids nanoscale research
Hitachi High-Technologies has introduced a directly heated specimen holder for use with the high resolution HD-2300 scanning transmission electron microscope (STEM).
News from Hitachi High-Technologies (Electron Microscopy) ( 8 August 2005)
Microscope gains an extra dimension
A new, five-segment semiconductor backscattered electron detector with high sensitivity and fast response rates has been introduced for the S-3400N variable pressure SEM.
News from Hitachi High-Technologies (Electron Microscopy) (23 May 2005)
SEM boasts subnanometre resolution
The latest addition to the range of scanning electron microscopes from Hitachi High-Technologies claims the world's highest resolution for an SEM.
News from Hitachi High-Technologies (Electron Microscopy) (10 March 2005)
SEM improves display and signal mixing
The recently-launched S-3400N variable pressure scanning electron microscope from Hitachi High-Technologies has improved display and signal mixing facilities for greater versatility of operation.
News from Hitachi High-Technologies (Electron Microscopy) ( 7 February 2005)
VPSEM boasts outstanding performance
The S-3400N is a new variable pressure scanning electron microscope.
News from Hitachi High-Technologies (Electron Microscopy) (11 October 2004)
SEM boasts outstanding anaysis capabilities
The S-4300SE/N from Hitachi High-Technologies provides a unique combination of a field emission source and variable pressure in a truly analytical instrument.
News from Hitachi High-Technologies (Electron Microscopy) (12 August 2004)
TEM promises nanometre-level resolution
Outstanding spatial resolution at the nanometre level can be achieved on chemical element mapping in the HD-2300 scanning transmission electron microscope from Hitachi High-Technologies.
News from Hitachi High-Technologies (Electron Microscopy) (30 July 2004)
Microscope resolves to handle 8in wafers
The S-4800 FESEM from Hitachi High-Technologies represents a breakthrough in FESEM technology, offering resolution figures of 1.0nm at 15kV yet capable of handling specimens up to 8in diameter.
News from Hitachi High-Technologies (Electron Microscopy) (28 June 2004)
Beam deceleration boosts resolution
Beam deceleration technology is now an option for the S-4800 field emission scanning electron microscope (FESEM) from Hitachi High-Technologies.
News from Hitachi High-Technologies (Electron Microscopy) (19 May 2004)
Jones demonstrates benefits of electron microscopy
Hitachi High-Technologies has appointed Chris Jones as Applications Specialist and Demonstrator for its Electron Microscopy Division in the UK.
News from Hitachi High-Technologies (Electron Microscopy) (19 March 2004)
Scanning TEM claims 2nm resolution
The new HD-2300 scanning transmission electron microscope offers improved resolution and significantly enhanced analytical capabilities for materials and semiconductor applications.
News from Hitachi High-Technologies (Electron Microscopy) ( 2 February 2004)
TEM warms quickly to its task
The new PC-controlled H-9500 TEM from Hitachi High-Technologies is designed for rapid operation.
News from Hitachi High-Technologies (Electron Microscopy) ( 4 November 2003)
Microscope produces scanning transmission images
The S-5200 ultrahigh-resolution field emission scanning electron microscope can now be equipped with a transmission detector to allow scanning transmission images to be produced.
News from Hitachi High-Technologies (Electron Microscopy) (24 September 2003)
Scope for ultra-high resolution
Detector boosts microscope applications
Ion beam system samples semiconductors
Intel rewards quality improvement
High-resolution FESEM for large samples
Additional detector brings enhanced imaging
