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Product category: Stand-Alone Instruments
News Release from: Hitachi High-Technologies (Electron Microscopy) | Subject: S-4800 FESEM
Edited by the Electronicstalk Editorial Team on 25 June 2002
High-resolution FESEM for large samples
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A new FESEM combines the resolution capabilities normally associated with in-lens instruments with the sample handling of more conventional FESEMs.
A new FESEM which combines the resolution capabilities normally associated with in-lens instruments with the sample handling of more conventional FESEMs has been added to its range by Hitachi High-Technologies The S-4800 FESEM features a new objective lens design and enhanced E X B filter technology to collect and separate the various signals from pure secondary electrons, compositional secondary electrons and backscattered electrons