Click on the advert above to visit the company web site
Product category: Stand-Alone Instruments
News Release from: Hitachi High-Technologies (Electron Microscopy) | Subject: S-4700 field emission SEM
Edited by the Electronicstalk Editorial Team on 28 January 2002
SEM gets a better image
Request your FREE weekly copy of the Electronicstalk email newsletter. News about Stand-Alone Instruments and more every issue. Click here for details.
Hitachi High-Technologies has made a number of improvements to its S-4700 field emission SEM, which give significantly better image quality, particularly at low accelerating voltages.
Hitachi High-Technologies has made a number of improvements to its S-4700 field emission SEM, which give significantly better image quality, particularly at low accelerating voltages These include the introduction of a new snorkel objective lens and a new TTL (through-the-lens) detection system The new lens has been designed using the latest electron opt