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Product category: Stand-Alone Instruments
News Release from: Hitachi High-Technologies (Electron Microscopy) | Subject: S-4300SE/N
Edited by the Electronicstalk Editorial Team on 11 July 2003
Scope for ultra-high resolution
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The S-4300SE/N field emission variable pressure scanning electron microscope combines the high resolution and image quality of a field emission source with variable pressure operation.
The S-4300SE/N field emission variable pressure scanning electron microscope (FEVPSEM) combines the high resolution and image quality of a field emission source with the versatility of variable pressure operation to handle difficult samples The new microscope has a pressure operating range of 10-1000Pa, which means that it can be used to examine an even wider range of wet, oily or non-conducting samples than many VPSEMs