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Product category: Stand-Alone Instruments
News Release from: Hitachi High-Technologies (Electron Microscopy) | Subject: S-3400N
Edited by the Electronicstalk Editorial Team on 15 November 2005
Detector provides a powerful alternative
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Hitachi High-Technologies has introduced a new environmental secondary electron detector (ESED) for the S-3400N variable pressure scanning electron microscope.
Hitachi High-Technologies has introduced a new environmental secondary electron detector (ESED) for the S-3400N variable pressure scanning electron microscope The new detector provides a powerful alternative to traditional backscattered imaging used in the VPSEM and closely mimics a conventional secondary electron detector to give good surface information