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Product category: Stand-Alone Instruments
News Release from: Hitachi High-Technologies (Electron Microscopy) | Subject: HD-2300
Edited by the Electronicstalk Editorial Team on 30 July 2004
TEM promises nanometre-level resolution
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Outstanding spatial resolution at the nanometre level can be achieved on chemical element mapping in the HD-2300 scanning transmission electron microscope from Hitachi High-Technologies.
Outstanding spatial resolution at the nanometre level can be achieved on chemical element mapping in the HD-2300 scanning transmission electron microscope from Hitachi High-Technologies Mapping and analysis can be achieved using either electron energy loss spectroscopy (EELS) or energy dispersive X-ray (EDX) systems