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Product category: Stand-Alone Instruments
News Release from: Hitachi High-Technologies (Electron Microscopy) | Subject: S-3400N
Edited by the Electronicstalk Editorial Team on 07 February 2005
SEM improves display and signal mixing
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The recently-launched S-3400N variable pressure scanning electron microscope from Hitachi High-Technologies has improved display and signal mixing facilities for greater versatility of operation.
The recently-launched S-3400N variable pressure scanning electron microscope from Hitachi High-Technologies has improved display and signal mixing facilities for greater versatility of operation In addition to its sophisticated array of automated facilities, the S-3400N features the highly popular GUI first intr