Click on the advert above to visit the company web site
Product category: Stand-Alone Instruments
News Release from: Hitachi High-Technologies (Electron Microscopy) | Subject: S-5200 FESEM
Edited by the Electronicstalk Editorial Team on 16 April 2002
Additional detector brings enhanced
imaging
Request your FREE weekly copy of the Electronicstalk email newsletter. News about Stand-Alone Instruments and more every issue. Click here for details.
The ultra-high-resolution in-lens S-5200 FESEM from Hitachi High-Technologies has been enhanced with an optional electron detector for imaging backscattered electrons at low accelerating voltages.
The imaging versatility of the ultra-high resolution in-lens S-5200 FESEM from Hitachi High-Technologies Corporation has been enhanced with an optional electron detector for imaging backscattered electrons at low accelerating voltages This new accessory takes full advantage of the outstanding resolution of the S-5200 of 1.8nm at 1kV