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Product category: Stand-Alone Instruments
News Release from: Hitachi High-Technologies (Electron Microscopy) | Subject: TDS 92
Edited by the Electronicstalk Editorial Team on 05 March 2003
Detector boosts microscope applications
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A new technical datasheet details the use of the ESED environmental secondary electron detector in variable pressure scanning electron microscopes.
The ESED environmental secondary electron detector from Hitachi High-Technologies has significantly expanded the range of applications for the company's variable pressure scanning electron microscopes (VPSEMs) Use of the detector for the microscopy of electronic materials and devices and in materials science and life science is highlighted in a new technical datasheet from Hitachi, TDS 92