Start with the news release PXI module supports JTAG/Boundary Scan Test from Goepel Electronic, which we summarised at the time by saying "At the Defence Systems and Equipment International (DSEI) event, Goepel Electronic launched its PXI 5396/FXT-x, a further series of JTAG/Boundary Scan digital I/O modules on the basis of the PXI bus. ". Several months prior to that, we featured the news release Goepel and SPEA add JTAG/boundary scan functions from Goepel Electronic: "Goepel Electronic and SPEA have introduced additional JTAG/boundary scan functions for the SPEA 4040 Flying Probe tester in the framework of the companies' long-term OEM agreement.".
 
In October 2008, we covered the news from Goepel Electronic - take a look at Goepel launches PX1 5396-X series which says: "Goepel Electronic has launched a series of JTAG digital I/O PXI modules named PXI 5396-X.".
 
Take a look also at the news release from Magma Design Automation, Semiconductor device failure analysis improved, as well as Reference design targets UMC 65nm process from Cadence Design Systems, and I/O module at the point of interface testing from Goepel Electronic.