Goepel and SPEA add JTAG/boundary scan functions

Goepel Electronic and SPEA have introduced additional JTAG/boundary scan functions for the SPEA 4040 Flying Probe tester in the framework of the companies' long-term OEM agreement.

The solution is based on the advanced Flying Prober Automatic Test Program Generator (ATPG) that is integrated in the JTAG/boundary scan development environment System Cascon.

For the first time, using the extended ATPG tool, the Flying Prober's bottom probes are now included in the Virtual ScanPin methodology for automatic test pattern generation.

The probes work as virtual bi-directional boundary scan pins in the frame of interconnection tests, and enable extended fault coverage, and in particular, for open faults in BGA components.

Utilising the integration of the two systems, the boundary scan software takes over the probe positioning, using the definition from the SPEA Board Export with test points on the upper and lower side of the UUT.

In addition to automatically generated tests, all probes can also be used for manual test program generation at same levels as the natural boundary scan cell.

The innovation is in the analogue measurement function, for example, the measurement of on-board voltage or measuring and evaluating unknown signal levels within a boundary scan test program.

Another feature is re-test, where a potentially faulty or intermittent test step can be re-contacted and the user can program the number of repeats.

This results in a higher quality of test as false failures are eliminated.

The enhanced IEEE Std.1149.1 tools are integrated in System Cascon from V 4.4.1b onwards, and are activated per license manager.

The features are available at no cost for OEM customers with a valid maintenance contract.

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