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Asset Intertech
All articles from Asset Intertech
Scanworks asserts structural tests and diagnostics
Asset Intertech's Scanworks platform for embedded instrumentation supports both signal integrity design validation and circuit board test for the Intel Xeon processor 5500 series, codenamed Nehalem.
News from Electronicstalk, 13 May 2009
MicroMater license available in two configurations
Following a licensing arrangement, the capabilities of Asset Intertech's MicroMaster e-JTAG CPU emulation functional test and debug system can be deployed by global enterprises.
News from Electronicstalk, 29 October 2008
Test platform works with embedded serdes
Asset InterTech is modifying its ScanWorks platform for open embedded instrumentation tools to support Avago Technologies' embedded instrumentation technology for ASICs.
News from Electronicstalk, 20 August 2008
System managers support boundary scan
ScanWorks can be used with Maxim's MAX16031 and MAX16032 system monitors and MAX16046-MAX16049 system managers through the devices' IEEE1149.1 interfaces.
News from Electronicstalk, 13 August 2008
Diagnostic system supports new Intel chips
MicroMaster allows design and manufacturing engineers to apply powerful functional test and diagnostic routines to circuit board designs featuring Nehalem or Tolapai processors
News from Electronicstalk, 18 June 2008
Emulator is first to support Intel's Atom
uMaster and Asset's ScanWorks platform can help manufacturers identify faults early in the design cycle, improving prototype yields and accelerating time to market.
News from Electronicstalk, 2 April 2008
Acquisition unites test technologies
The complementary technologies of Asset and ITT furthers the convergence of Asset's JTAG-based structural test technology and ITT's functional testing capabilities.
News from Electronicstalk, 5 December 2007
Boundary-scan system supports Intel's IBIST
IBIST leverages the boundary-scan IEEE1149.1 specification as the hardware and software communication methodology for accessing and controlling its embedded on-chip capabilities.
News from Electronicstalk, 24 October 2007
Lab assesses designs for testability
Design-for-test lab reduces the time to market for new products by identifying JTAG testability issues before prototypes are assembled.
News from Electronicstalk, 14 February 2007
Boundary-scan system opens up to third parties
Asset InterTech has enhanced its ScanWorks boundary-scan (JTAG) system, increasing its openness to third-party technologies and products.
News from Electronicstalk, 17 October 2006
Boundary-scan controller adds functional test
Controller card can apply both JTAG and functional microprocessor emulation tests on the same circuit board.
News from Electronicstalk, 9 October 2006
Malaysian office provides boundary-scan support
Asset InterTech has established a Southeast Asian boundary-scan technology centre in Penang, Malaysia.
News from Electronicstalk, 18 September 2006
Motorola standardises on boundary scan systems
Asset InterTech has signed a multiyear contract to become Motorola's worldwide supplier of boundary scan (IEEE1149.1 or JTAG) electronic test systems.
News from Electronicstalk, 17 July 2006
System-level JTAG demo to prove concept
Asset InterTech and Firecron will demonstrate system-level JTAG test and programming in a proof-of-concept system at the upcoming European Board Test Workshop.
News from Electronicstalk, 22 May 2006
Shanghai is central to Asset in Asia
Asset InterTech has launched its own boundary-scan technology centre in Shanghai, China.
News from Electronicstalk, 8 March 2006
Analyser picks up magazine award
Asset InterTech's DFT Analyzer has been honoured with a "Best In Test" award from Test and Measurement World.
News from Electronicstalk, 3 January 2006
Online boundary-scan validation service launched
Asset InterTech has announced an online service that validates the accuracy of boundary scan description language files that describe the boundary-scan characteristics of semiconductor devices.
News from Electronicstalk, 29 November 2005
Boundary scan files validated online
A new online service validates the accuracy of boundary scan description language files that describe the boundary-scan characteristics of semiconductor devices.
News from Electronicstalk, 21 November 2005
Analyser keeps watch over design for test rules
A new DFT analyser reduces manufacturing and tests costs by validating the boundary-scan design-for-test features in a circuit board design before any prototypes are assembled.
News from Electronicstalk, 21 October 2005
Boundary-scan test system debugs new Xbox
Microsoft's selection of the ScanWorks boundary-scan test system for its Xbox 360 marks the first major announcement of boundary scan in a high-volume consumer electronics product.
News from Electronicstalk, 24 May 2005
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