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Product category: Design and Development Software
News Release from: Asset InterTech | Subject: ScanWorks
Edited by the Electronicstalk Editorial Team on 24 February 2005
Agilent integrates JTAG test system
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Agilent Technologies has seamlessly integrated ScanWorks, a JTAG test system from Asset InterTech, into its new next-generation in-circuit test (ICT) system, the Medalist i5000.
Agilent Technologies has seamlessly integrated ScanWorks, a JTAG test system from Asset InterTech, into its new next-generation in-circuit test (ICT) system, the Medalist i5000 In addition, Agilent features ScanWorks as the premier JTAG bundled solution on its Medalist ICT product line, including the i5000 and 3070 Series systems
This article was originally published on Electronicstalk on 20 Aug 2008 at 8.00am (UK)