Product category: Board-Level Instruments
News Release from: Asset InterTech | Subject: PCI-200EJ
Edited by the Electronicstalk Editorial Team on 9 October 2006
Boundary-scan controller adds functional test
Controller card can apply both JTAG and functional microprocessor emulation tests on the same circuit board
A new controller card released by Asset InterTech is the first boundary-scan controller capable of applying both JTAG and functional microprocessor emulation tests on the same circuit board. Asset's new PCI-based ScanWorks PCI-200EJ controller supports boundary-scan test and onboard programming operations as well as microprocessor functional emulation testing.
This article was originally published on Electronicstalk on 9 October 2006 at 8.00am (UK)
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Developed in collaboration with strategic partner, International Test Technologies (ITT) of Ireland, the PCI-200EJ controller increases test coverage by supporting ScanWorks' JTAG operations and the functional testing capabilities of ITT's micro-Master emulation testers.
The ScanWorks PCI-200EJ controller also streamlines the entire test application process by combining both types of tests on one platform.
'With the new PCI-200EJ test engineers have one unified platform for JTAG structural tests and functional emulation tests', said Alan Sguigna, Vice President of Sales and Marketing for Asset.
'By sharing the same user interface and the same physical connector to the unit under test (UUT), the ScanWorks PCI-200EJ controller speeds the entire test process'.
'For example, a failure of a functional test can be quickly diagnosed by applying a boundary-scan test to pinpoint any structural faults'.
Initially, the PCI-200EJ supports all of the ScanWorks boundary-scan operations and emulation testing on PowerPC microprocessors.
Support in the future is planned for Intel Pentium and XScale processors as well.
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