ATE systems
(a sub category of Test and measurement)
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ATE systems
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Showing 1-25 of 398 articles
Goepel expands Scanflex platform by controllers
Goepel Electronic has introduced the SFX/COMBO1149-(x), said to be the first desktop compact controller within the framework of the boundary scan hardware platform Scanflex.
News from Goepel Electronic, Apr 11, 2011
DC e-loads save rack space in ATE applications
Safety Power Group has introduced a range of air-cooled programmable DC electronic loads (e-loads) that offer a small footprint to save rack space in automatic test equipment (ATE) applications.
News from Safety Power, Aug 11, 2010
Nanotechnology test library now available on CD
Keithley Instruments has released a CD containing technical papers, articles, data sheets and links to online seminars covering a wide range of nanotechnology test applications.
News from Keithley Instruments, Jul 14, 2010
Keithley releases Model 3732 Quad 4x28 matrix card
The Model 3732 Quad 4x28 ultra-high density reed relay matrix card is for automated switch and measure applications requiring multiple instrument connections and high-crosspoint density and speed.
News from Keithley Instruments, May 17, 2010
Lecroy selects Keithley RF/microwave switch system
Lecroy has selected Keithley Instruments' System 46 (S46) RF/microwave switch system as part of the original equipment for its USB 3.0 Test Suite product family.
News from Keithley Instruments, Feb 5, 2010
Stantronic launches G5100A waveform generator
Stantronic Instruments has introduced the G5100A arbitrary function generator from Picotest.
News from Stantronic Instruments UK, Oct 1, 2009
Keithley webinar to focus on PV measurements
Keithley Instruments is to broadcast a free web-based seminar, entitled 'Photovoltaic Measurements: Testing the Electrical Properties of Today's Solar Cells', on 27 May 2009.
News from Keithley Instruments, May 13, 2009
White paper describes semiconductor technologies
Keithley Instruments has published a white paper on how semiconductor characterisation and parametric test solutions are evolving to keep pace with changes in the semiconductor industry.
News from Keithley Instruments, Mar 25, 2009
Keithley releases KTEI V7.2 upgrade
Keithley Instruments has introduced a range of hardware, firmware and software enhancements to its Model 4200-SCS semiconductor characterisation system.
News from Keithley Instruments, Mar 24, 2009
Keithley offers range of cabling solutions
Keithley Instruments has introduced cabling solutions capable of handling current-voltage (I-V), capacitance-voltage (C-V) and pulsed I-V signals with a single set of cables.
News from Keithley Instruments, Mar 24, 2009
20% off Keithley test and measurement products
Keithley Instruments is offering a 20 per cent discount off the list price on a range of test and measurement instruments to its European customers.
News from Keithley Instruments, Mar 18, 2009
S600 parametric test product line discontinued
Keithley Instruments has announced that it is discontinuing its S600 series parametric test product line.
News from Keithley Instruments, Mar 3, 2009
Keithley to hold webinar on MIMO testing
Keithley Instruments will broadcast a free webinar called 'Demystifying Testing of MIMO Communications Systems' on 5 March 2009.
News from Keithley Instruments, Mar 2, 2009
Intellitech adds support to concurrent testers
Intellitech has added support for the NEC Electronics V850ES microcontrollers to its Ultratap pod and PT100 concurrent testers used in volume manufacturing.
News from Intellitech Corp, Feb 19, 2009
Infineon XC866 support added to Intellitech units
Intellitech has announced that it has added support for the Infineon XC866 family of microcontrollers to its Ultratap pod and PT100 concurrent testers used in volume manufacturing.
News from Intellitech Corp, Feb 19, 2009
Keithley to hold Hall Effect measurement webinar
Keithley Instruments will broadcast a free, web-based seminar entitled 'Hall Effect Measurements Fundamentals' on 19 February.
News from Keithley Instruments, Feb 18, 2009
JTAG releases development and debug software
JTAG Technologies has released the JTAG ProVision and JTAG Visualizer development and hardware debug tools.
News from JTAG Technologies, Feb 6, 2009
Keithley publishes 2009 product guide
Keithley Instruments has released its 2009 Test and Measurement Product Guide.
News from Keithley Instruments, Feb 6, 2009
Cellmetric introduces LTE test signal generator
Cellmetric has announced the launch of a long-term evolution (LTE) eNodeB 4G base station test signal generator.
News from CellMetric, Jan 21, 2009
Keithley announces cost reduction actions
Keithley Instruments has announced cost reduction actions in response to the rapid deterioration in global economic and industry conditions.
News from Keithley Instruments, Dec 19, 2008
Keithley releases ACS Basic Edition software
Keithley Instruments has introduced ACS Basic Edition characterisation and curve tracer software for component test applications.
News from Keithley Instruments, Dec 2, 2008
Keithley develops production test for Fujitsu
Keithley Instruments is developing a Wimax device production test for two 802.16e Wimax devices from Fujitsu Microelectronics.
News from Keithley Instruments, Nov 25, 2008
JTAG offers digital I/O scan module
JTAG Technologies has introduced the compact JT 2149/MPV Digital I/O Scan (DIOS) module, which debuts the company's Scan-Configurable Interface Logic (SCIL) technology.
News from JTAG Technologies, Nov 13, 2008
Keithley announces financial results
Keithley Instruments has announced results for its fourth quarter and the year ending 30 September 2008.
News from Keithley Instruments, Nov 7, 2008
Keithley enhances Signalmeister software
Keithley Instruments has expanded its Signalmeister software platform to include RF signal analysis along with RF signal generation.
News from Keithley Instruments, Oct 30, 2008
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