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ATE Systems
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Burn-in tester boosts memory module reliability
Kingston Technology has developed a proprietary test platform designed to detect early-life failure (ELF) in server memory modules.
News from Kingston Technology (18 November 2004)
Platform automates handset testing
TestQuest will demonstrate the latest enhancements to its TestQuest Pro platform at the Smart Phone Show at the London ExCel on 5th and 6th October 2004.
News from TestQuest International ( 5 October 2004)
Parametric test systems bound for Korea
Keithley Instruments has received a multiple-fab, multiple-system order from a leading Korean semiconductor manufacturer for its S680 DC/RF parametric test systems. Brochure available
News from Keithley Instruments ( 6 September 2004)
All-in 200mm wafer tester aims for 130nm devices
Keithley Instruments has developed a packaged, ready-to-run parametric test system claiming unrivalled cost-per-pin and total price/performance ratio. Brochure available
News from Keithley Instruments (16 July 2004)
Semiconductor survey shows continued satisfaction
For the 16th consecutive year, Advantest has been rated as one of the world's top equipment suppliers in the annual customer satisfaction survey conducted by industry-analyst firm VLSI Research.