ATE Systems

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Electro-emulation tester links bench with line

New from Schaffner, the W629 electro-emulation tester offers OEMs efficient strategies for testing finished products and partial assemblies during the manufacturing process. Brochure available

News from Schaffner (26 September 2005)

Monitor cuts testing costs for automotive products

User application article Q-Star Test has announced that Freescale Semiconductor, and in particular its Tempe site, has selected its QD-1020, multi-site IDDQ monitor for running IDDQ tests on its automotive products.

News from Q-Star Test (23 September 2005)

Functional tester adapts to Intel's built-in tests

Asset InterTech and International Test Technologies are supporting Intel Interconnect Built-In Self Test embedded test technology on the uMaster functional test platform.

News from Logic Technology ( 6 September 2005)

Hamilton wins 2005 IEEE Joseph F Keithley Award

The IEEE has named Dr Clark A Hamilton as the recipient of the 2005 IEEE Joseph F Keithley Award in Instrumentation and Measurement. Brochure available

News from Keithley Instruments ( 5 September 2005)

Finkenzeller takes on Northern Europe

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