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ATE Systems

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Alliance to ensure mixed-signal interoperability

ATEEDA has joined the Synopsys in-Sync programme to develop and support interoperability between its mixed-signal test tool and the Synopsys HSpice simulator.

News from ATEEDA ( 2 May 2007)

Handler accelerates memory testing

Dynamic test handler for memory devices such as DDR2/3-SDRAM enables parallel testing of up to 512 devices and boasts a throughput of 20,000 units per hour.

News from Advantest (Europe) (26 April 2007)

Increasing interest spurs LogicVision

LogicVision has announced its financial results for the first quarter of 2007, ended 31st March 2007.

News from LogicVision Europe (26 April 2007)

Vectorless technology cuts the cost of ATE

A low-cost in-circuit test system is targeted at the requirements of ODMs who need "just enough test".

News from Agilent Technologies Europe (25 April 2007)

ATE advances aid production automation

At Nepcon in Birmingham Seica will showcase several new products within its Viva Integrated Platform that aim to meet the challenges of today's focus on automation.

News from Seica (23 April 2007)

Chip tester appoints new senior VP of Engineering

A semiconductor test sp