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ATE Systems

Archive page 4 of 16

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Analysing time-dependent observations

Harmonic Software has released version 2.1 of STSA, the statistical time series analysis toolbox for O-Matrix.

News from Harmonic Software (14 December 2006)

Expanded use of embedded test solutions

 User application article   LogicVision has announced that its embedded test solutions have been selected by NEC Electronics to help ensure impeccable quality and manufacturability, targeting SoC designs.

News from LogicVision Europe (14 December 2006)

Embedded memory tests aid parallel processing

 User application article   Rapport has adopted LogicVision's leading edge memory BIST solutions for next-generation Kilocore Architecture-based products.

News from LogicVision Europe ( 5 December 2006)

Automatic test system keeps Boeings in the air

Pakistan International Airlines has acquired a first ATEC Series 6 test system from EADS Test and Services plus 28 associated test programs for maintaining its Boeing fleet in Karachi, Pakistan.

News from EADS Test and Services ( 1 December 2006)

Upgrade for semiconductor characterisation

KTE Interactive V6.1 is an updated version of the powerful measurement software for the Model 4200-SCS semiconductor characterisation system.  Brochure available