Latest news on Electronicstalk categorised by product type
ATE Systems
Archive page 9 of 16
Our RSS feed for ATE Systems press releases
Platform puts wireless devices to the test
A novel automated platform enables designers to quickly test WirelessUSB-enabled products without the need for expensive RF test equipment.
News from Cypress Semiconductor (17 May 2005)
Cable harness tester handles up to 384 connections
The WK140 cable harness tester can test up to 384 connection points and detect open and short circuits and miswiring. Brochure available
News from Schaffner ( 6 May 2005)
Addition enhances avionics product portfolio
Aeroflex has acquired the business of JcAIR Test Systems from aerospace and defence supplier, Goodrich Corp for $35 million in cash.
News from Aeroflex (22 April 2005)
Automatic tester checks out PCB manufacture
The Auto-SIR is a novel automatic tester that measures surface insulation resistance of printed circuit boards.
News from Concoat (19 April 2005)
Tester gets the measure of advanced IC reliability
The S510 semiconductor reliability test system is a high-channel-count turnkey solution for use in reliability testing and lifetime modelling of the world's most advanced ULSI CMOS processes. Brochure available