Board-level instruments

(a sub category of Test and measurement)

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Latest articles from 'Board-level instruments'

News releases from this sub-category

Showing 1-25 of 573 articles

National Instruments opens technical paper contest

National Instruments has announced a graphical system design case study contest and invited engineers and scientists to share how they are utilising the company's products in their applications.

News from National Instruments, May 20, 2011

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Counter timers aimed at panel builders and OEMs

Switchtec has introduced H7E counter timers from Anly, offering users monitoring facilities in control panels and other equipment where lapsed time or events must be recorded.

News from Switchtec, May 17, 2011

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TME offers CRT-V1 timer from Cobi Electronic

TME is offering the CRT-V1 timer from Cobi Electronic, which offers 16 universal time functions and can operate in a delta-star switch, crosspoint switch or automatic landing switch configuration.

News from Transfer Multisort Elektronik, May 13, 2011

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Open-source project provides IEEE training

Goepel Electronic has announced the accession to the goJTAG initiative, which is the first university-driven open-source project aimed at providing a full package for a JTAG/Boundary Scan newcomer.

News from Goepel Electronic, May 10, 2011

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NI DAQ system measures up to 256 signals

National Instruments (NI) has released an Ethernet-based CompactDAQ modular data-acquisition system for measuring up to 256 channels of electrical, physical, mechanical or acoustic signals.

News from National Instruments, Aug 5, 2010

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Peak Test Services introduces short-travel probe

The P909 Series from Peak Test Services is a short-travel probe for battery contact applications.

News from Peak Test Services, Jul 27, 2010

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Waveform generators for electronic device testing

Tabor Electronics has released its Wavexciter series of high-speed arbitrary waveform generators for electronic test applications.

News from Tabor Electronics, Jun 4, 2010

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Signal generators for digital datacom applications

Anritsu has introduced the MG3690C series of RF/microwave signal generators for testing microwave components, subsystems as well as verifying radar and communications systems.

News from Anritsu, May 27, 2010

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Mod5 Flip-Top Socket for 0.5mm-pitch BGA devices

The Mod5 Flip-Top BGA Socket provides a compact, surface-mount test solution for micro-BGA chipsets used in applications such as handheld, mobile and wireless product development.

News from Advanced Interconnections, May 24, 2010

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Clare provides wiring analyser for Hipot testing

Clare Instruments is offering the Horizon II, said to provide rapid and easy Hipot testing of cables, connectors and harnesses up to 1,500 DC/1067V AC.

News from Clare Instruments, Apr 27, 2010

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Spectrum launches M3i.21xx digitiser series

Spectrum has introduced the M3i.21xx series digitiser, which is based on the M3i platform.

News from Spectrum Systementwicklung Microelectronic, Mar 29, 2010

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Teseq releases PMM 9010/30P EMI receiver/analyser

Teseq is offering a digital EMI receiver/analyser with optimum measurement parameters for EMC labs that do not require full CISPR compliance for radiated emissions measurements.

News from Teseq, Mar 25, 2010

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Signal generator recreates tough RF environments

RF Engines (RFEL) has developed a 32-channel radio-frequency (RF) signal generator that is designed to enable challenging RF environments to be recreated in laboratories to test RF equipment.

News from RF Engines, Feb 3, 2010

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AE develops precision amplifier for EMC testing

AE Techron has developed the 7224 precision amplifier for the EMC compliance testing market.

News from AE Techron, Jan 28, 2010

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Goepel introduces controller at Productronica

Goepel Electronic has introduced the SFX/ASL1149-(x) controller, part of the Scanflex JTAG/Boundary Scan hardware platform, at the Productronica trade fair.

News from Goepel Electronic, Dec 10, 2009

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NI products expand PXI semiconductor test options

National Instruments has introduced 10 PXI products that expand the capabilities of PXI for mixed-signal semiconductor test.

News from National Instruments, Nov 27, 2009

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Pickering releases 41-752 battery simulator

Pickering Interfaces' 41-752 is a six-cell battery simulator that provides up to 300mA of current from each cell.

News from Pickering Interfaces, Nov 9, 2009

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Hamamatsu to exhibit CCD board-level cameras

Hamamatsu will be introducing the C10990 series of OEM CCD board-level cameras at the Photonex 2009 Exhibition.

News from Hamamatsu Photonics UK, Oct 2, 2009

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PXI module supports JTAG/Boundary Scan Test

At the Defence Systems and Equipment International (DSEI) event, Goepel Electronic launched its PXI 5396/FXT-x, a further series of JTAG/Boundary Scan digital I/O modules on the basis of the PXI bus.

News from Goepel Electronic, Sep 30, 2009

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Highland announces digital fan-out buffer

Highland Technology introduces the Model P730 high-speed, multipurpose digital fan-out buffer.

News from Highland Technology, Sep 24, 2009

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Adlink announces launch of PCI-98x6 digitisers

Adlink Technology has announced the release of an expansion to its digitiser product line with the introduction of three PCI digitisers - the PCI-98x6 series.

News from Adlink Technology, Sep 23, 2009

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Lecroy USB 3.0 Test Suite supports Superspeed USB

Lecroy has brought out a single-source line-up of test instruments to support the USB (Universal Serial Bus) 3.0 standard, also known as Superspeed USB.

News from LeCroy, Sep 11, 2009

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Goepel's AOI system inspects larger PCBs

Goepel Electronic's desktop AOI system Opticon Smartline is now able to inspect PCBs up to a maximum board size of 400 x 390mm.

News from Goepel Electronic, Sep 2, 2009

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Vector signal generator has wide frequency range

The Rohde and Schwarz SMIQ06B is a vector signal generator with a frequency range of 300KHz to 6.4GHz.

News from Advanced Test Equipment Rentals, Aug 28, 2009

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NI Labview Datafinder aids faster retrieval

National Instruments has announced the release of the NI Labview Datafinder Toolkit, an extension of the Labview graphical system design platform that helps engineers and scientists find data.

News from National Instruments, Aug 20, 2009

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  • TME offers CRT-V1 timer from Cobi Electronic

    TME is offering the CRT-V1 timer from Cobi Electronic, which offers 16 universal time functions and can operate in a delta-star switch, crosspoint switch or automatic landing switch configuration.
  • National Instruments opens technical paper contest

    National Instruments has announced a graphical system design case study contest and invited engineers and scientists to share how they are utilising the company's products in their applications.
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