Keithley enhances ACS Basic Edition
A Keithley Instruments product story
Edited by the Electronicstalk editorial team Aug 31, 2009
Keithley Instruments has enhanced its ACS Basic Edition software, adding support for a broader line of source-measure (SMU) instrumentation.
ACS Basic Edition combines high-speed hardware control, device connectivity, and data management into a tool optimised for part verification, debugging, and analysis.
Keithley has enhanced its ACS Basic Edition software adding support for a broader line of SMU instrumentation.
With the introduction of Version 1.1, the software can support a broader range of DC voltage and current test capabilities.
The product is compatible with the company's full SMU offering.
Depending on the SMU selected, ACS Basic Edition supports sourcing and measuring up to 5A or 1100V DC on individual channels.
The source and measure ranges are suitable for tests on evolving photovoltaic panels/solar cells and high-power electronics in research, failure analysis and inspection applications.
It also supports combining different SMU models into a single test, allowing easier configuration, test creation, and test execution - with no need to write code.
Keithley developed ACS Basic Edition to maximise the productivity of technicians and engineers responsible for packaged-part characterisation in applications ranging from early device research to development, quality verification and failure analysis.
It is delivered complete with a library of pre-configured component test routines to minimise start-up time, reduce the need for code development, and simplify the component testing process.
ACS Basic Edition can generate a family of curves on a packaged part quickly and also offers the flexibility to save, compare, and correlate results easily.
Version 1.1 of the package provides expanded hardware options: The software supports combining hardware from any of Keithley's SMU families into a single test, including Series 2600 and 2600A System Sourcemeter instruments, Series 2400 Sourcemeter instruments, the Model 4200-SCS Semiconductor Characterisation System, and the Model 237 High-Voltage SMU.
As a result, users can test with a variety of SMU instrumentation optimised for a device's specific current and voltage requirements.
A communication settings window allows configuring a variety of external GPIB instrumentation, such as a switch matrix and capacitance-voltage (C-V) meter, into an ACS Basic Edition system.
A 'Saved Test Info' dialogue box enables the selection of the instrument models with which the test will be associated on the test-selection window.
With this feature, users can organise their tests as they collect important data or update their test method.
Enhancements to the dialogue include a Generic device option, an improved user-defined device function and an instrument models listbox that includes all the instruments scanned by the software at startup.
Improvements to the data tab of all individual device tests simplify data visualisation by allowing all the data a user wants to include in a plot to be incorporated at one time.
The script editor has been enhanced to make script development and organisation more powerful for a number of different test module types.
Users have direct access to the XRCed GUI development tool, which lets them build GUIs for custom-test modules written in either Python or Test Script Processor (TSP) languages.
TSP scripts work with Series 2600, Series 2600A, and Model 3706 instruments.
Python scripts are used to communicate via GPIB to any of these instruments, as well as any general purpose hardware users want to control.
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