Yokogawa releases range of digital oscilloscopes

The Yokogawa DLM6000 mixed-signal oscilloscope is the flagship product in a new range of high-performance digital oscilloscopes.

These oscilloscopes feature bandwidths up to 1.5GHz, memory of 6.25M points per channel, an intuitive graphical user interface and a number of advanced analysis features.

The new range consists of five four-channel models: the two DLM6000 mixed-signal oscilloscopes with 16- or 32-bit logic capability and bandwidths of 500MHz and 1GHz; and three DL6000 versions with bandwidths of 500MHz, 1GHz and 1.5GHz, respectively.

All the instruments have a maximum sampling rate of 5GS/s, apart from the DL6154 1.5GHz instrument, which has 10GS/s.

The 16/32-bit logic inputs on the DLM6000 Series models have a maximum toggle rate of 250 or 100MHz, depending on the probe used.

The new user interface makes the instruments easy to use.

It incorporates a physical layout with backlit buttons, on-screen visual elements including graduated menus, and a four-direction selector button and Yokogawa's 'jog shuttle' control.

In addition to the exceptional ease of use provided by the new user interface, the oscilloscopes offer an extensive range of capabilities for waveform characterisation, powerful tools for detecting glitches and anomalies, advanced signal enhancement and noise-reduction technologies, and a range of options for serial-bus analysis and power measurement.

The combination of 32-bit logic inputs and four high-speed analogue channels makes the mixed-signal models ideal for the testing and debugging of embedded systems, while the built-in Windows capability along with a range of software drivers means that the instruments can easily be integrated into automated test systems.

Advanced logic-analysis capabilities include state display, a 'virtual D/A' feature that calculates the analogue signal from the logic information and displays the result on screen, and bus bundle and symbolic decoding facilities.

The DLM6000 can sample the logic channels simultaneously with the analogue channels and at the same maximum speed.

The instruments feature high-speed acquisition and quick response, with an uncompromised update rate of up to 25,000 waveforms per second, a history memory function for more efficient waveform observation and analysis, and powerful zoom and search functions.

The history memory function allows the user to recall and display previously acquired data from up to 2000 screens of past waveforms.

This ability to redisplay and subsequently analyse data offers significant benefits in troubleshooting and analysis.

Also included are powerful functions for searching the memory for desired waveforms and zoom functions for observing these waveforms in detail.

In addition to searching based on criteria such as signal edge, pulse and multichannel state, the history memory can be searched by serial or parallel waveform patterns and waveform parameters.

Users can quickly find desired waveform data in memory, enlarge the area with the zoom function, and scroll the data.

A dual-window zoom function simultaneously zooms in on two areas.

Two individual zoom factors and positions can be set with independent timescales and displayed simultaneously.

Using the automatic scroll function it is possible to automatically scroll waveforms captured in long memory and change the position of the zoom areas.

Powerful trigger functions include the ability to trigger conditions using a logic signal as the source.

Various trigger conditions can be combined to capture only the desired signals.

Signal enhancement capabilities include new IIR and FIR bandwidth filtering, a high-resolution mode, averaging and real-time maths channels.

Serial bus analysis options allow analysis to be carried out on I2C, SPI, CAN LIN and UART bus systems, with triggers for these bus types included in the package.

Hardware acceleration enables serial bus analysis to be carried out in real time.

This capability makes it easy to discriminate between partial software failures and physical-layer waveform problems when troubleshooting systems by observing the physical-layer characteristics of signals.

With the dual-window zoom function, the instruments can simultaneously analyse and display waveforms from buses running at different speeds.

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