Mixed-signal scopes bring logic to the benchtop
DL9000 Series MSO models allow for simultaneous multichannel monitoring of devices and electronic circuits that handle both digital and analogue signals.
Yokogawa has added three new models to its DL9000 Series of mixed-signal oscilloscopes (MSOs).
The DL9705L, DL9510L and DL9505L complement the DL9710L model released in 2007.
The DL9705L is a 32-channel instrument with a bandwidth of 500MHz and a sampling rate of 5Gsample/s; the DL9510L has 16 channels, a bandwidth of 1GHz and a sampling rate of 5Gsample/s; and the DL9505L has 16 channels, a bandwidth of 500MHz and a sampling rate of 5Gsample/s.
The launch of these new products is in response to the growing demand for mixed-signal devices in recent years.
The DL9000 Series MSO models allow for simultaneous multichannel monitoring of devices and electronic circuits that handle both digital and analogue signals.
Together with the DL9710L (32 channels, 1GHz, 5Gsample/s), these new models give users more choice, and enable them to select an instrument tailored to their application needs.
Unlike existing mixed-signal oscilloscopes that offer limited display and analysis capabilities for logic signals, the Yokogawa MSO family is optimised for users who wish to analyse logic signals as well as analogue waveforms.
The instruments feature the full state display and bus display functions typically found on logic analysers, allowing co-ordinated analysis of analogue and logic signals.
Other features include high-speed acquisition and quick response, with an uncompromised update rate of up to 25,000 waveforms per second, a history memory function for more efficient waveform observation and analysis, and powerful zoom and search functions.
The history memory function allows the user to recall and display previously acquired data from up to 2000 screens' worth of past waveforms.
This ability to redisplay and subsequently analyse data offers significant benefits in troubleshooting and analysis.
The MSOs also include powerful functions for searching the memory for desired waveforms, and zoom functions for observing these waveforms in detail.
In addition to searching based on criteria such as signal edge, pulse, and multichannel state, the history memory can be searched by serial or parallel waveform patterns and waveform parameters.
Users can quickly find desired waveform data in memory, enlarge the area with the zoom function, and scroll the data.
A dual-window zoom function simultaneously zooms in on two areas.
Two individual zoom factors and positions can be set with independent timescales and displayed simultaneously.
Using the automatic scroll function, it is possible to automatically scroll waveforms captured in long memory and change the position of the zoom areas.
Powerful trigger functions include the ability to trigger conditions using a logic signal as the source.
Various trigger conditions can be combined to capture only the desired signals.
The Yokogawa MSOs allow the user to assign 32bit or 16bit logic signals into up to five groups, with no limit to the number of bits allowed in each group.
Groups are assigned using a graphical interface for flexible and easy settings.
Even in cases such as where a reconfigurable device's pin assignments have been changed, the corresponding adjustments can be made by simply by changing the mapping of the groups.
Analyses such as bus display, state display, and digital/analogue conversion can be executed on a group-by-group basis.
Options are available to allow serial bus analysis to be carried out on I2C, SPI, CAN and LIN bus systems, with triggers for these bus types included as standard features.
These functions make it easy to discriminate between partial software failures and physical-layer waveform problems when troubleshooting systems by observing the physical-layer characteristics of signals.
With the dual-window zoom function, the instruments can simultaneously analyse and display waveforms from buses running at different speeds.
Automatic waveform parameter measurements include maximum, minimum, peak-to-peak, pulsewidth, period, frequency, rise time, fall time, and duty ratio.
It is also possible to calculate the statistics of waveform parameters, such as the average, maximum, minimum and standard deviation, over multiple cycles within an acquisition or over multiple acquisitions.
A mask test function is supplied as standard that can be used as an automatic parameter measurement function for eye-pattern analysis or for evaluating the signal quality of data communication.
Signal quality can be easily analysed on the oscilloscope.
A further option is available for power-supply analysis using the waveform computation function, the statistical competition function, and the automated parameter measurement function.
Harmonic analysis of power-supply current based on EN61000-3-2 is also supported.
Each instrument measures approximately 350 x 200 x 285mm and weighs approximately 8kg.
Not what you're looking for? Search the site.
Browse by category
- Active components (13681)
- Passive components (3639)
- Design and development (10279)
- Enclosures and panel products (4035)
- Interconnection (3703)
- Electronics manufacturing, packaging (3506)
- Industry news (2108)
- Optoelectronics (1981)
- Power supplies (3058)
- Subassemblies (5681)
- Test and measurement (5836)