Visit the AdTech Ceramics web site

Metryx

Unit 2 Manor Park
Nailsea Wall Lane, Nailsea
Bristol
BS48 4DD
UK

Latest articles from this company

News releases from this company

Directors accelerate global business development

Mark Berry has been appointed North America and Europe Business Director, and Gary Ditmer has joined Metryx as Asia Business Director.

News from Electronicstalk, 13 April 2007

Mass metrology proves popular with chip makers

Metryx has received orders from three new customers for its innovative mass metrology Mentor technology.

News from Electronicstalk, 16 October 2006

Peace comes to advisory board

Elton Peace is joining its Advisory Board of Directors at Metryx.

News from Electronicstalk, 6 March 2006

Cunnane adds semiconductor processing experience

Nanotechnology weight metrology specialist Metryx has appointed Liam Cunnane as Technology Director for North America.

News from Electronicstalk, 8 February 2006

Wafer metrology tool offers atomic layer accuracy

A new nondestructive nanotechnology weight metrology tool handles high-volume production of 300mm semiconductor wafers.

News from Electronicstalk, 11 January 2006

Weight metrology tool keeps wafers honest

A novel nanotechnology weight metrology tool offers atomic layer measurement accuracy and is designed to handle the demands of volume production environments.

News from Electronicstalk, 15 December 2005

Weight metrology proves popular in wafer fabs

Metryx has won orders worth up to $4 million for its revolutionary Mentor high-throughput simple-to-use nondestructive metrology tool that offers atomic layer measurement accuracy.

News from Electronicstalk, 29 September 2005

Weight metrology aids thin-film research

A manual, benchtop nondestructive R and D metrology tool that offers atomic layer measurement accuracy to 7 angstroms of oxide has been launched by Metryx.

News from Electronicstalk, 9 September 2005

Metrology tool checks wafer processing steps

A high-throughput, simple-to-use, nondestructive metrology tool that offers atomic layer measurement accuracy has been developed by Metryx of Bristol, UK.

News from Electronicstalk, 26 July 2005

Not what you're looking for? Search the site.

Back to topBack to top

Pro-talk

Reach an audience of thousands

Featured articles

Contact
Visit the AdTech Ceramics web site

Search by company

A Pro-talk Publication

A Pro-talk publication