Cunnane adds semiconductor processing experience

Nanotechnology weight metrology specialist Metryx has appointed Liam Cunnane as Technology Director for North America.

Nanotechnology weight metrology specialist Metryx has appointed Liam Cunnane as Technology Director for North America.

Cunnane brings to Metryx over 20 years' experience in the semiconductor capital equipment industry - notably with Electrotech - and then as North American Engineering Manager for Trikon Technologies.

As Technology Director, Cunnane will bring this experience to bear in supporting specialist Metryx agents located in almost 30 states.

Cunnane comments: "Metryx has a unique technology which has immense potential in device production".

"This has been demonstrated by the growth and success of the company in a short space of time".

"It's exciting to be part of such a dynamic team, and to be able to assist the integration of leading edge technology into volume production environments".

Metryx technology for atomic layer accuracy in metrology and SPC in wafer processing applications is endorsed by major 200 and 300mm fabs worldwide.

Vice President and cofounder of the company, Dr Adrian Kiermasz, adds: "Liam's experience and knowledge of semiconductor processing and equipment assures expert support to our agents and customers in North America, and continues to strengthen the Metryx global infrastructure".

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