Product category: Board-Level Instruments
News Release from: National Instruments | Subject: LabView and board-level instruments
Edited by the Electronicstalk Editorial Team on 16 January 2008
Test technologies keep up with design
complexity
Eric Starkloff highlights five trends he expects will significantly influence the test and measurement industry over the next three years.
Test engineers in industries ranging from aerospace and defence to consumer electronics are facing the challenge of testing increasingly complicated designs with shrinking timelines and budgets To address these issues, engineers and scientists are incorporating new test and measurement technologies that are capable of meeting complex design requirements without raising costs
This article was originally published on Electronicstalk on 21 Mar 2001 at 8.00am (UK)
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The first trend involves the increased use of multicore/parallel test systems.
To continue realising performance gains without increased clock rates, processor manufacturers are developing processors with multiple cores on a single chip.
With multicore processors, test engineers can develop automated test applications capable of achieving the highest possible throughput through parallel processing.
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