Product category: ATE Systems
News Release from: Cascade Microtech | Subject: Tesla power device characterisation system
Edited by the Electronicstalk Editorial Team on 29 May 2007
Power ICs now tested on the wafer
Power device characterisation system answers on-wafer probing challenges for engineers and test technicians who need to characterise their power devices.
New from Cascade Microtech, the Tesla power device characterisation system solves the on-wafer probing challenges for engineers and test technicians who need to characterise their power devices The power semiconductor market is projected to grow from US $25.8 billion in 2007 to $34.2 billion in 2009, fuelled by the use of power devices in everything from industrial products to consumer electronics
This article was originally published on Electronicstalk on 8 Jan 2008 at 8.00am (UK)
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The broad use of power semiconductors has created a pressing need to characterise devices quickly and efficiently.
Design engineers and test technicians are under pressure to speed up the time to market for new power devices.
To drive dramatic gains in productivity, Cascade Microtech designed Tesla, the industry's first power device measurement system providing a complete on-wafer solution for overtemperature, low contact resistance measurements of power semiconductors up to 60A and 3000V.
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For years, power semiconductor device manufacturers have been forced to package their devices prior to characterisation and model extraction.
Wafer-level measurements on power devices have historically been fraught with unreliable or inaccurate data, extra costs and uncertain delays in development schedules.
Cascade Microtech's Tesla system finally solves this problem.
"The Tesla power device measurement system will reduce costs by eliminating the hassles of packaging devices before we characterise them", says Edouard de Fresart, Power Device Section Manager, Smartmos Technology centre, Freescale Semiconductor.
"It will have a huge effect on our productivity by reducing the wasted time and steps we incur in packaging while still providing accurate test data".
"Worldwide demand for power semiconductors is growing due to the double-digit demand for more efficient power utilisation", says Philippe Roussel, Project Manager, Power Electronics, Yole Developpement, Lyon, France.
Power devices such as MOSFETs, bipolar junction transistors, rectifiers, thyristors and insulated gate bipolar transistors are widely used in cellphone infrastructures, laptop computers, alternative energy vehicles, home appliances, electric trains and more.
Power devices are characterised by their ability to accommodate higher current density, higher power dissipation and/or higher reverse breakdown voltage.
Cascade Microtech's Tesla system features two new wafer probes, including a high current probe that reduces the potential for probe and device destruction during testing.
The probe can support an unprecedented 10A of current in continuous mode and up to 60A of current in pulsed mode.
To reduce device heating, the probe tip is designed to minimise contact resistance at the wafer-to-probe interface.
The Tesla system also features a high voltage probe that ensures a high performance electrical measurement path at high voltages.
The high voltage probe provides the capability to make coaxial measurements up to 3000V and triaxial measurements up to 1100V.
In addition, both the high current and the high voltage probes feature a replaceable tip that is easily changed.
The Tesla system's wafer chuck provides state-of-the-art handling for thin wafers.
An exclusive chuck top technology provides the right amount of vacuum in a delicate method that protects against wafer breakage and probe damage, all while ensuring a minimal contact resistance.
Other safety features of the Tesla system include the highly insulated and electrically shielded cable assemblies that provide both triaxial performance and high current/high voltage handling capabilities.
To ensure operator safety, ease of setup and configuration, Tesla offers a safety interlock system and remote system operation.
The measurement environment and every component in the measurement path is designed and tested by Cascade Microtech to comply with voltages up to 3000V.
Tesla is a turnkey, scaleable system.
It is optimised for ease of purchase and configuration to create a safe testing environment for power semiconductor devices.
Tesla includes Cascade Microtech's industry-leading wafer probe station and probes and proprietary safety components.
The Tesla system starts at US $200,000.
Pricing depends on user options selected.
Delivery is 12 weeks from receipt of order.
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