Product category: Test Accessories
News Release from: Cascade Microtech | Subject: Elite 300
Edited by the Electronicstalk Editorial Team on 08 January 2008
Wafer probing provides 45nm resolution
Users of the Elite 300 wafer probe station won't have to retool at each process node or lose business to competing foundries with more accurate test capabilities.
Cascade Microtech has released a new 300mm wafer probe station, designed to meet the worldwide need for advanced on-wafer measurements for semiconductor devices The Elite 300 sets a new standard for extremely accurate and reliable 300mm wafer probing for devices with process nodes at 45nm and below
This article was originally published on Electronicstalk on 29 May 2007 at 8.00am (UK)
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"The Elite 300 platform is designed to lower process development costs and shorten time to market through superior electrical measurement capability", said Geoff Wild, Chief Executive Officer, Cascade Microtech.
Elite 300 applications include RF/DC device characterisation and modeling, wafer-level reliability, IC failure analysis and design debuggung.
Users of the Elite 300 wafer probe station won't have to retool at each process node or lose business to competing foundries with more accurate test capabilities.