Product category: ATE Systems
News Release from: Advantest (Europe) | Subject: M6241
Edited by the Electronicstalk Editorial Team on 26 April 2007
Handler accelerates memory testing
Dynamic test handler for memory devices such as DDR2/3-SDRAM enables parallel testing of up to 512 devices and boasts a throughput of 20,000 units per hour.
Available now from Advantest, the M6241 is a dynamic test handler for memory devices such as DDR2/3-SDRAM It offers parallel test for up to 512 devices and boasts a throughput of 20,000 units per hour
This article was originally published on Electronicstalk on 11 May 2001 at 8.00am (UK)
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