Product category: ATE Systems
News Release from: Advantest (Europe) | Subject: T5375 memory test system
Edited by the Electronicstalk Editorial Team on 20 June 2001
Memory test system more than doubles its
speed
The Advantest T5375 memory test system is capable of testing up to 128 devices simultaneously at speeds of either 143 or 286MHz DDR.
The Advantest T5375 memory test system is capable of testing up to 128 devices simultaneously at speeds of either 143 or 286MHz DDR This new low-footprint system is being targeted at front-end testing of commodity memories such as DRAM, synchronous DRAM, double datarate SDRAM and SRAM, as well as back-end testing of flash memories
This article was originally published on Electronicstalk on 11 May 2001 at 8.00am (UK)
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