Product category: ATE Systems
News Release from: Advantest (Europe) | Subject: T6371
Edited by the Electronicstalk Editorial Team on 10 May 2001
LCD driver test
system doubles throughput
Addressing a surge in demand for liquid crystal displays, the Advantest T6371 offers twice the throughput offered by previous test systems
The system can simultaneously test either two TFT drivers or four chips that contain a controller and an LCD driver. As consumers increasingly demand higher resolutions, manufacturers are working hard to increase the number of greyscales provided by TFT displays. This, coupled with the demand for larger screens, has translated into a dramatic rise in the amount of pins found on TFT drivers.
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Because conventional testers are unable to accommodate this increase in pins, measuring the precision output greyscale voltages consumes an inordinate proportion of the device's overall testing time.
However, with the T6371 and its digitiser unit, users can perform voltage measurements of drivers with a maximum of 128 pins.
This marks a sixteen-fold improvement over previous systems, and results in a dramatic increase in testing throughput.
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Moreover, because the T6371 is also capable of digital testing at up to 125MHz, the system can be used to test the TFT driver's high-speed interface.
Spurred on by the demand for better colour screens, the trend toward dramatically higher pin counts also holds true for chips that integrate both a controller and a LCD driver.
To perform fast testing of such multiple-pin ICs, the T6371 has the ability to measure LCDs that have a maximum of 1280 pins.
The system also employs a per-pin comparator architecture, which enables the user to perform high-speed function testing.
The system's testing station can simultaneously measure up to four such devices.
The T6371 uses Advantest's highly praised Viewpoint operating system, which employs a graphical user interface to ease operability.
Because every model in Advantest's T6600 SoC Test System series runs on Viewpoint, testing programs created on these testers can be easily transferred for use on the T6371.
Finally, because the T6371 comes with the ability to test devices with up to 256 channels, users can also perform testing of logic ICs such as microcontrollers.
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