Flash tester runs up to 128 devices at a time: News from Advantest (Europe)

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With the ability to simultaneously test up to 128 devices, Advantest reckons its T5771 front-end Flash memory test system is a low-cost solution for achieving higher test throughput. To perform functional testing on next-generation Flash memories, the T5771 is capable of testing at up to 100MHz with an overall timing accuracy of +/-0.5ns. Despite the general upward evolution of memory capacities, the size of Flash memories have actually been shrinking, thanks to innovations such as "multivalue technology" - which gives single memory cells the ability to store multiple bits.

The T5771 was designed specifically to meet these challenges.

With two test stations that leverage Advantest's proprietary "test array architecture", the new system is capable of simultaneously testing a maximum of 128 memory devices.

In addition, the T5771 offers a number of other functions to boost test throughput, such as the ability to test or mask defective blocks on a block-by-block basis.

The system also incorporates improved Flash Match circuitry that reduces programming overhead by one-half that of the preceding system.

Furthermore, thanks to extremely dense packaging that uses highly integrated ASICs and multi-chip modules, the T5771 has a compact design that provides four times the simultaneous testing capacity of its predecessor, per area.

At the same time, Advantest has reduced the number of system components.

Together with the system's eight-fold increase in overall simultaneous testing capacity, the combined effects of these design and manufacturing efforts have helped lower the cost of per-device test to approximately one-third that of the preceding system.

To ensure easy operation, the T5771's software for evaluation, analysis, and debugging - collectively known as Future Suite - employs graphical user interfaces.

State-of-the-art software design has made it possible to simplify test programs, allowing users to write test programs for simultaneous testing in the same way they would write for a single device.

Test programs are written in C so the T5771 can connect smoothly with manufacturing line networks, ensuring fast and efficient device evaluation, analysis, and data feedback.

The T5771 will begin shipment in July 2001.

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