Yamaichi develops semiconductor test contactor

The Y-Red semiconductor modular test contactor system from Yamaichi Electronics is designed for lab applications such as burn-in/HAST, qualification, failure analysis and initial lab tests.

The volume test socket and hinged-type system covers BGA, LGA and QFN packages with dimensions of up to 45 x 45mm and pitches starting from 0.4mm.

Standardised single parts allow lead times within three to four weeks between enquiry and product delivery.

The contactor features a top-side removable insert and tool-free cover mounting to minimise changeover times during testing semiconductors.

Y-Red is equipped with a high-performance spring probe with crown plunger tip for BGA and conical plunger tip for LGA and QFN packages.

The two-piece pin combines good mechanical and electrical behaviour.

The contact resistance is less than 50mohms and exhibits stability up to 500,000 mating cycles.

The pin is available for the standard temperature range of -40C up to +125C and a high-temperature range of -55C up to +150C.

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