Product category: Stand-Alone Instruments
News Release from: Tektronix | Subject: TLA700 Series
Edited by the Electronicstalk Editorial Team on 25 March 2005
Logic analysers turn to DDR2 duties
Tektronix has developed new fully buffered DIMM test solutions for logic analysers in conjunction with Nexus Technology.
Note: Readers of the free Electronicstalk email newsletter get to read news like this as soon as it is announced. Find out how to register for your free copy now.
Tektronix has developed new fully buffered DIMM (FB-DIMM) test solutions for logic analysers in conjunction with Nexus Technology. Tektronix demonstrated both FB-DIMM and second generation PCI Express test solutions for their industry leading oscilloscopes at the recent Intel Developer Forum (IDF), San Francisco. FB-DIMM and second generation PCI Express are the two most recent examples of the industry trend to replace legacy shared parallel buses with high-speed point-to-point serial buses.
FB-DIMM is an interconnect architecture for high-end memory connections, enabling memory chips to operate at a throughput of 6.4Gbyte/s, double the current throughput of today's DDR-2-400 modules.
Similarly, PCI Express second generation operates at 5Gbit/s, double the bandwidth of the current PCI Express specification.
'Having new test and validation capabilities available for FB-DIMM and second generation PCI Express early in advance of first silicon power on is essential to help the broader community of companies who are working to design and implement these technologies', said Jim Pappas, Director of Initiative Marketing for Intel's Digital Enterprise Group.
Tektronix' TLA700 Series logic analyser and Nexus Technology's NEX-FBD-NEXVu enable designers to verify, test and debug the advanced memory buffer (AMB) control of the DDR2 SDRAM.
Additionally, the FB-DIMM northbound and southbound traffic can be monitored by Tektronix' TLA700 Series logic analyser and a Nexus Technology NEX-FBD-LAI interposer card.
'To keep pace with more complex and shorter design cycles, designers need to optimise their FB-DIMM testing and validation with powerful solutions that enable them to address these challenges', said David Bennett, Vice President, Logic Analysers Product Line, Tektronix.
'Tektronix offers the world's most powerful logic analysers, which can be utilised in concert with specific support packages such as Nexus Technology's latest offerings to provide a robust toolset for FB-DIMM and DDR2 testing'.
'We found the combination of the Tektronix TLA700 logic analyser and NEX-FBD-NEXVu from Nexus Technology to be extremely useful in our FBDIMM debug work', said Terry Lee, Executive Director of Advanced Technology and Strategic Marketing, Micron System Memory Group.
'This combination enables easy connectivity without requiring an interposer card and it allows us to probe signals, as seen by the memory chips, with minimal impact on signal integrity'.
'In addition, the analogue multiplexer capability of the Tektronix TLA allows these signals to be viewed with a Tektronix oscilloscope without having to reprobe, simplifying signal integrity measurements'.
At IDF, Tektronix demonstrated new RT-Eye Serial Compliance and Analysis software modules that transform a host oscilloscope into a powerful automated validation and compliance-testing platform for FB-DIMM and second generation PCI Express.
The modules run on the Tektronix TDS6000 Series and TDS/CSA7000 Series oscilloscopes including the recently announced TDS6124C and TDS6154C.
The latter is the world's fastest oscilloscope designed for the most demanding serial data applications.
• Tektronix: contact details and other news
• Email this news to a colleague
• Register for the free Electronicstalk email newsletter
• Electronicstalk Home Page
Related Stories
Complete software toolset enhances logic analysers
The iLink toolset is an integrated suite of logic analyser, oscilloscope and accessories for maximum design, debug and troubleshooting efficiency using TLA700 Series logic analysers.
Analyser aids in network development
Tektronix and IneoQuest have jointly produced a comprehensive support package for the development of next-generation network equipment operating at speeds of 10Gbit/s and beyond.
Mixed-signal scope aids embedded debug
Mixed signal oscilloscopes combine three powerful capabilities into one small and lightweight portable device for embedded design and debug.
Waveform generator for digital RF tests
Arbitrary waverform generator is useful for testing digital RF technologies including software-defined radios and radars, WiMAX, WiFi, MIMO, and UWB.
Real-time spectrum analyser is tester of the year
DesignVision 2007 Award for Test and Measurement Equipment goes to Tektronix RSA6100A Series real-time spectrum analyser.
Search the Pro-Talk network of sites
