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Product category: Design and Development Software
News Release from: Synopsys | Subject: DFT MAX
Edited by the Electronicstalk Editorial Team on 24 July 2006
Scan compression automation proves
popular
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DFT MAX scan compression automation solution has been instrumental in reducing test costs related to data inflation on more than 50 successful tapeouts since its general release in September 2005.
Synopsys DFT MAX scan compression automation solution has been instrumental in reducing test costs related to data inflation on more than 50 successful tapeouts since its general release in September 2005 CSR, Genesis, Micronas, Nvidia Corporation, and more than 50 other leading semiconductor firms are using this tool to reduce test costs on their nanometre designs
This article was originally published on Electronicstalk on 8 Nov 2005 at 8.00am (UK)