Product category: Design and Development Software
News Release from: Synopsys | Subject: DFT MAX's Adaptive Scan technology
Edited by the Electronicstalk Editorial Team on 08 November 2005
Adaptive scan technology reduces tester
costs
Genesis Microchip, supplier of display image ICs, has successfully deployed DFT MAX adaptive scan technology to reduce tester costs.
Genesis Microchip, supplier of display image ICs, has successfully deployed DFT MAX to reduce tester costs DFT MAX's adaptive scan technology enables scan compression that reduces both test application time and test data volume by up to 50 times over traditional scan techniques
This article was originally published on Electronicstalk on 19 Apr 2001 at 8.00am (UK)
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