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Product category: Design and Development Software
News Release from: Synopsys | Subject: TetraMAX
Edited by the Electronicstalk Editorial Team on 25 October 2005

Diagnostic tools boost IC yields

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Taiwan Semiconductor Manufacturing Company (TSMC) has adopted Synopsys' TetraMAX yield diagnostic tools for its scan diagnostics service

TSMC uses TetraMAX diagnostics to quickly and accurately isolate manufacturing defect locations. Efficiently locating defects is critical to identifying yield issues quickly during the production ramp of deep submicron designs. 'We are pleased that Synopsys was proactive in working with us as an early partner to support a yield diagnostics flow for our innovative 3D graphics processors manufactured by TSMC', said Dan Smith, Director of Hardware Engineering, Nvidia Corporation.

'Synopsys is not only providing us with an advanced diagnostics solution, but also is allowing us to easily and securely transfer the necessary design data to TSMC in order for them to run TetraMAX diagnostics'.

As process geometries shrink, resolving manufacturing defects becomes more challenging and it becomes critical to use tester-generated failure data to isolate the defect location.

Synopsys' TetraMAX allows designers to generate high quality test patterns in the shortest time, and then allows process engineers to easily diagnose parts that fail those test patterns.

A seamless and simple flow from design to manufacturing is key to the adoption of yield diagnostics in a production environment.

'TSMC differentiates itself by helping its customers achieve fast time to revenue'.

'Clearly, fast time-to-production yield is part of that initiative and TetraMAX is an extremely effective tool in furthering that initiative', said Ed Wan, Senior Director of Marketing at TSMC.

'Synopsys is pleased to help both our customers and TSMC achieve their yield goals in the timeliest and most cost effective manner', said Antun Domic, Senior Vice President and General Manager, Synopsys Implementation Group.

'TetraMAX is an essential technology in the Galaxy Design Platform for both our design-for-test, as well as our design-for-yield solutions'.

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