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Product category: Design and Development Software
News Release from: Synopsys | Subject: TetraMAX
Edited by the Electronicstalk Editorial Team on 29 September 2006
Automatic test pattern generator
accelerated
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Enhancements to the TetraMAX automatic test pattern generator result in a typical speedup of three times or more in runtime performance across all design styles.
Synopsys has announced enhancements to its TetraMAX automatic test pattern generation (ATPG) product that result in a typical speedup of three times (3x) or more in runtime performance across all design styles compared with the previous version The faster ATPG runtime for both stuck-at and transition delay testing provides substantial productivity gains for designers involved in creating high-quality manufacturing tests
This article was originally published on Electronicstalk on 31 Oct 2001 at 8.00am (UK)