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Product category: Design and Development Software
News Release from: Synopsys | Subject: TetraMAX
Edited by the Electronicstalk Editorial Team on 20 March 2007
Diagnostics accelerate yield learning
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UMC has adopted Synopsys TetraMAX diagnostics to accelerate yield learning for designs that use the Synopsys DFT MAX scan compression automation solution.
UMC has adopted Synopsys TetraMAX diagnostics to accelerate yield learning for designs that use the Synopsys DFT MAX scan compression automation solution Rapid yield learning depends on the accuracy and efficiency of failure analysis, a manually intensive and time-consuming process of identifying the individual circuit in a design that could cause a device to fail