Product category: ATE Systems
News Release from: LogicVision Europe | Subject: ETMemory
Edited by the Electronicstalk Editorial Team on 17 October 2007
eDRAM tester supports new options
Embedding large blocks of DRAM into SoCs creates new test and yield challenges due to the higher circuit densities of eDRAMs over more traditional embedded SRAMS
LogicVision's ETMemory product line supports built-in self-test and built-in self-repair of embedded DRAMs (eDRAMs). ETMemory is widely used for testing embedded SRAMs at leading semiconductor and system companies worldwide. Building on that success, LogicVision has now added the critical requirements for test and self-repair of eDRAMs.
This article was originally published on Electronicstalk on 17 October 2007 at 8.00am (UK)
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ETMemory is a new generation of embedded memory test and yield capabilities specifically targeted at chips designed at advanced technology nodes
As silicon process technologies for eDRAMs have become more economical, the application of eDRAMs in SoCs is growing rapidly.
While embedding large blocks of DRAM into SoCs provides many cost and performance advantages, it also creates new test and yield challenges due to the higher circuit densities of eDRAMs over more traditional embedded SRAMS.
This trend in turn is driving the need for advanced on-chip test and repair capabilities to enable cost-effective approaches for meeting quality and yield requirements.
ETMemory represents the industry's only comprehensive eDRAM test and repair solution.
It supports all eDRAM communication requirements such as address interleaving, address multiplexing and auto refresh.
Support for both hard and soft programmability allows user-defined algorithms to be either integrated into embedded test controllers at design time or downloaded into embedded test controllers at test time.
Soft programmability provides the ability to handle unforeseen defect mechanisms during production, enabling quality improvement without costly re-spins.
The solution includes on-chip global fuse management, removing the need for external fuse data storage, simplifying the manufacturing test flow.
The system offers automated RTL-level integration and verification flow for all on-chip test and repair resources integrated with all leading physical implementation flows.
It is compatible with LogicVision's suite of silicon diagnostic solutions, including Silicon Insight and ETAccess.
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