Product category: Design and Development Software
News Release from: LogicVision Europe | Subject: ETMemory
Edited by the Electronicstalk Editorial Team on 6 June 2006
Memory repair analysis goes on-chip
ETMemory is a new generation of embedded memory test and yield capabilities specifically targeted at chips designed at advanced technology nodes
Related stories
Embedded tests enhance memory reliability
LogicVision and Dolphin Technology have developed an integrated and comprehensive self-testable and self-repairable memory solution for advanced nanometre designs
Increasing interest spurs LogicVision
LogicVision has announced its financial results for the first quarter of 2007, ended 31st March 2007
LogicVision has announced the availability of ETMemory, its newest generation of embedded memory test and yield capabilities specifically targeted at chips designed at advanced technology nodes. ETMemory, is the culmination of over a decade of embedded memory test development and refinement and provides the most robust and field proven embedded memory test and diagnostic capabilities in the industry.
To achieve the highest quality levels at the denser technology nodes, support for both hard and soft programmability allows user defined algorithms to be either integrated into embedded test controllers at design time or downloaded into embedded test controllers at test time.
Hard programmability achieves high quality levels with low area overhead, while soft programmability provides the ability to handle unforeseen defect mechanisms during production, enabling quality without costly respins.
In addition, growing embedded memory sizes and densities are driving the need for increasing levels of memory redundancy to ensure good memory yields.
Further reading
Distributor appointment expands Japanese support
LogicVision has signed up Noah Corporation as distributor for its products in Japan
Distribution deal expands N European coverage
LogicVision has appointed ISS Group to distribute its products in the UK, Norway, Poland, Finland, Ireland, Denmark and Sweden
ETMemory, provides fast on-chip memory repair analysis as well as on-chip memory self-repair to fully support these growing redundancy requirements.
ETMemory, includes LogicVision's comprehensive automation suite that provides test rule checking, test planning, integration and verification all at the RT level.
It also includes LogicVision's ETProduction capability which allows the encapsulation of fail datalog functionality into a dynamically linked library (DLL) that is linked directly into the user test program.
ETMemory can be custom tailored to a customer's specific test and yield needs, offering multiple options to the robust base solution.
Flexible options include post-silicon programmability, repair analysis and automated self-repair.
'As the market leader in memory test, we continue to push to define the state-of-the-art in embedded memory testing, taking it beyond identifying failures to automated repair and analysis', said Jim Healy, President and CEO for LogicVision.
'This technology allows designers to reap the benefits of nanometre design technology, with less risk of memory failures'.
ETMemory is available immediately in limited release.
ETMemory, works seamlessly with other LogicVision tools and is interoperable with all major physical design flows, including Cadence Design Systems, Magma Design Automation, and Synopsys.
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