Product category: ATE Systems
News Release from: LogicVision Europe | Subject: Embedded test solutions
Edited by the Electronicstalk Editorial Team on 14 December 2006
Expanded use of embedded test solutions
LogicVision has announced that its embedded test solutions have been selected by NEC Electronics to help ensure impeccable quality and manufacturability, targeting SoC designs
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LogicVision's solutions for automotive microcontroller applications had been utilised by NEC Electronics in the past, and based on prior successes LogicVision solutions were selected for use across other projects. 'Our customers demand the lowest DPM (defects per million) levels possible to meet their overall quality needs,' said Shinichi Iwamoto, general manager, 1st Microcomputer Division, NEC Electronics.
'LogicVision's embedded test solutions have allowed us to meet our stringent quality requirements while at the same time reducing overall cost of test'.
'Based on these results we're now expanding the usage of LogicVision solutions to advanced SoC designs at smaller process geometries'.
Growing device complexity and shrinking process technologies have made cost-effective, high quality testing increasingly difficult for semiconductor manufacturers.
Further reading
Wintegra signs up for memory BIST
Wintegra has selected LogicVision's leading-edge memory BIST solution, ETMemory, to help it meet its silicon manufacturing quality goals
Tundra takes quick route to IEEE1149.6
LogicVision's ETBoundary product provides a boundary scan solution for embedded test and diagnosis of integrated circuit pin functions and board-level interconnect
Nanometer processes have created new challenges in detecting hard to model, or un-modeled defects.
LogicVision achieves high quality test through application of a large number of at-speed pseudorandom test patterns, resulting in significantly greater defect coverage than alternative approaches.
LogicVision test techniques provide excellent correlation with functional behavior, as pseudorandom-BIST timing closely mimics functional design stress conditions and detects performance defects that are only visible under functional conditions.
'Increasingly semiconductor and system companies are turning to LogicVision to meet their device test and quality requirements and reduce overall cost of test, as they design ever more complex devices in 90 and 65nm technology nodes,' said Jim Healy, president and CEO at LogicVision.
'We're excited to be providing our unique logic and memory test solutions to NEC Electronics to help them achieve their uncompromising DPM requirements while lowering their cost of test'.
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