Product category: ATE Systems
News Release from: Logic Technology | Subject: ScanWorks for Intel IBIST on the uMaster platform
Edited by the Electronicstalk Editorial Team on 6 September 2005

Functional tester adapts
to Intel's built-in tests

Asset InterTech and International Test Technologies are supporting Intel Interconnect Built-In Self Test embedded test technology on the uMaster functional test platform

Asset InterTech, a leader in boundary-scan (IEEE1149.1/JTAG) test and in-system programming (ISP), and International Test Technologies, a leader in microprocessor emulation-based board test and debug, have jointly developed support for Intel Interconnect Built-In Self Test embedded test technology on International Test Technologies' uMaster functional test platform.

By combining at-speed processor-based functional tests and Intel IBIST-specific tests, electronics manufacturers can increase efficiencies and reduce test costs.

The Asset ScanWorks boundary scan system is the only JTAG platform that supports Intel IBIST.

Asset and International Test Technologies have had a strategic relationship since September 2004 when the two companies announced joint development and marketing activities.

Intel IBIST is an embedded technology for testing chip-to-chip interconnects and validating high-speed bus designs.

Intel IBIST uses a circuit board's boundary-scan infrastructure as the hardware and software communication methodology for accessing and controlling embedded on-chip Intel IBIST capabilities.

Intel has embedded Intel IBIST capabilities into many high-speed interfaces on its server chipsets and processors to lower overall cost of test and more effectively validate high-speed buses such as PCI Express (PCIe), fully buffered DIMM (FBD) and others.

Asset's easy yet powerful ScanWorks boundary-scan test and ISP environment is currently used by leading electronics companies such as Cisco, Lucent Technologies, Agilent, BAE Systems, Alcatel, Hewlett-Packard, Ericsson, Raytheon, SBS, Solectron, Rockwell Collins, EMC and others.

'Integrating ScanWorks Intel IBIST support on the uMaster platform continues Asset's leadership position as the only boundary-scan supplier with tools to accelerate the deployment of Intel's next-generation test technology', said Tim Caffee, Asset's Director of Business Development.

'And now with the capabilities of uMaster's microprocessor-based functional test, high-volume manufacturers have a platform for test suites that achieves high test coverage and ensures product quality'.

Billy Fenton, CEO of International Test Technologies, pointed out that next-generation Intel-based circuit boards will require both CPU emulation functional test and Intel IBIST to achieve high test coverage.

'Circuit boards these days have very few, if any, test points designed into them'.

'This and the presence of high-frequency buses dictate nonintrusive, structural and at-speed functional test methods'.

'Integrating ScanWorks Intel IBIST support on the uMaster addresses these needs'.

ScanWorks for Intel IBIST on the uMaster platform is available now from Logic Technology.

Licences are sold as an addon option to standard ScanWorks test stations or new customers may purchase a ScanWorks for Intel IBIST Development Station.

Standard and network licences are available, ensuring flexible pricing options and low cost of ownership.

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