Switch mainframes enable semiconductor testing

Keithley Instruments has introduced the six-slot 707B and single-slot 708B switch matrix mainframes, which are optimised for semiconductor test applications in lab and production environments.

By providing significantly higher command-to-connect speeds, these switch mainframes make faster test sequences and greater overall system throughput possible.

They also support Keithley's Model 7174A Air Matrix 8x12 high-speed, low-leakage matrix card - the first standard switch capable of achieving less than 100fA of offset current on all pathways.

The 707B and 708B also support three other popular Keithley matrix cards and are ideal for semiconductor test system configurations that include Keithley's Series 2600A System Source Meter instruments, the Model 4200-SCS Semiconductor Characterisation System, and fully automated testers such as the S500 ACS Integrated Test Systems and S530 Semiconductor Parametric Test Systems.

The new digital control platform supports faster command-to-connect speeds for higher test throughput - even when using the GPIB communications mode, the 707B can improve throughput by as much as 40 per cent without changing any code.

The updated front panel interface simplifies tasks such as configuration management and switch pattern programming, and also displays programmable row and column names, crosspoint status (open, closed) and status messages.

The mainframes also store hundreds of switching configurations and channel patterns in non-volatile memory and recall them for later use.

The embedded Test Script Processor (TSP) in the Models 707B and 708B allows test scripts to be executed within the instrument itself, improving the speed of connect-source-measure sequences.

TSP-Link is a high-speed system expansion and coordination interface that simplifies linking instruments and switches for faster inter-unit communication and control.

It provides a high-speed, low-latency interface to other TSP-based hardware, simplifying system scaling as new requirements evolve.

New control options and interfaces in the 707B and 708B offer greater flexibility for configuring high-performance switching systems.

The they include the industry-standard GPIB interface with both modern SCPI/ICL and traditional DDC commands.

Both mainframes can be incorporated into existing test systems such as the Model 4200-SCS Semiconductor Parameter Analyzer or S500 ACS Integrated Test Systems, without the need for new drivers or software revisions.

Like all instruments compliant with the LXI standard, the 707B and 708B have a built-in web page for remote control and also support programming and control via a USB bus.

In addition to their ease of integration with the Model 4200-SCS semiconductor parameter analyser, the 707B and 708B work seamlessly with systems that incorporate Series 2600A instruments, such as Keithley's S500 ACS Integrated Test Systems and S530 Semiconductor Parametric Test Systems.

These mainframes share the same embedded TSP, Lua scripting language and TSP-Link interface as the Series 2600A instruments, and support the Model 7174A Ultra Low Current Switch Matrix, which complements the 2636A's low current sensitivity.

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