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Interface adapter for test and measurement tasks

A Keithley Instruments product story
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Edited by the Electronicstalk editorial team Jun 28, 2010

Keithley Instruments has introduced the model KUSB-488B USB-to-GPIB interface adapter designed to help test engineers and researchers lower their cost of test, measurement and ownership.

To minimise the cost associated with switching to a new adapter, the model KUSB-488D's driver library is fully command-compatible with Keithley's traditional GPIB command set and National Instruments' command set, making it plug-and-play compatible with existing applications.

Keithley Instruments has introduced the Model KUSB-488B USB-to-GPIB Interface Adapter

Keithley Instruments has introduced the Model KUSB-488B USB-to-GPIB Interface Adapter

The driver library is also compatible with Keithley's PCI-based model KPCI-488LPA GPIB interface, making it easy to switch from either a PCI or USB approach to GPIB control, protecting users' software investment and lowering their overall cost of test.

The KUSB-488B provides complete support for Windows 2000/XP/Vista.

The KUSB-488B also supports industry-standard VISA (Virtual Instrument Software Architecture) libraries to ensure compatibility with applications using VISA.

For OEMs, a utility is included to install the driver software silently, bypassing the normal installation so that the driver can be installed with the OEM's software.

The interface ships with 32-bit dynamic link libraries for Application Development Environments (ADEs) running under Windows XP/2000/Vista and drivers for the most current programming languages, including Microsoft Visual Basic, Visual C++, Visual Studio, .Net, Borland Delphi, Labview v7.0 and up (VISA and IEEE-488.2), and Labwindows/CVI v7.0 and up (VISA and IEEE-488.2).

A diagnostic/interactive tool is included for quick verification of communication between the interface and a GPIB-capable instrument, such as Keithley's digital multimeters (DMMs), Sourcemeter instruments, switch mainframes and cards, low level measurement systems, and a variety of other specialised test solutions.

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