Product category: Stand-Alone Instruments
News Release from: Keithley Instruments | Subject: Model 4200-SCS
Edited by the Electronicstalk Editorial Team on 31 October 2001
Capacitance characterisation added to
chip tester
Keithley Instruments has developed capacitance characterisation software for its Model 4200-SCS semiconductor characterisation system.
Keithley Instruments has developed capacitance characterisation software for its Model 4200-SCS semiconductor characterisation system The new capacitance characterisation capabilities allow users to conduct simultaneous high frequency (HF) and quasistatic (QS) C-V measurements on wafer devices with a single voltage sweep, using Keithley's Model 82 simultaneous C-V instrumentation
This article was originally published on Electronicstalk on 2 Apr 2007 at 8.00am (UK)
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