Semiconductor tester gains extra capabilities
A Keithley Instruments product story
Edited by the Electronicstalk editorial team Apr 2, 2007
Significant enhancements to a Semiconductor Characterisation System enable new features like Flash memory testing, high-power RF device testing, and pulse testing for advanced semiconductor materials.
Keithley Instruments announces the newest release of hardware and software advances for its award-winning Model 4200-SCS Semiconductor Characterisation System.
The lab-based system includes tightly integrated DC and pulse-measurement capabilities with complete application packages for turn-key solutions.
An enhanced pulse generator card and a new scope card offer powerful new capabilities to researchers working on cutting-edge semiconductor research and production.
Significant enhancements to Keithley's award-winning Model 4200-PIV package and two new application solutions extend the Model 4200-SCS's versatile DC and pulse hardware and software into ne