Visit the National Instruments web site
Click on the advert above to visit the company web site

Product category: Design and Development Software
News Release from: Atrenta | Subject: SpyGlass DFT
Edited by the Electronicstalk Editorial Team on 17 January 2002

Analysis tool checks testability of RTL
code

Request your FREE weekly copy of the Electronicstalk email newsletter. News about Design and Development Software and more every issue. Click here for details.

Atrenta's SpyGlass DFT incorporates two new engines to find testability issues at register transfer level (RTL) that would normally only be identified at the gate level.

SpyGlass DFT is the latest addition to Atrenta's popular SpyGlass predictive analysis tool that adds two new engines to find testability issues at RTL (register-transfer level) that normally only can be identified at the gate level According to Atrenta, no other tool can provide the comprehensive range of testability analysis offered by SpyGlass DFT

SpyGlass DFT includes rules for ATPG and BIST.

If RTL designers don't properly apply testability rules at the initial design stage, the design can have poor test coverage or even be untestable until extensive changes are made.

By letting designers write their RTL code to comply with testability rules before lengthy synthesis and simulation cycles, SpyGlass DFT can cut weeks or months off design cycles, eliminating or reducing gate-level debug and costly schedule delays.