Product category: ATE Systems
News Release from: Keithley Instruments | Subject: Model S470
Edited by the Electronicstalk Editorial Team on 16 July 2004
All-in 200mm wafer tester aims for 130nm
devices
Keithley Instruments has developed a packaged, ready-to-run parametric test system claiming unrivalled cost-per-pin and total price/performance ratio.
Keithley Instruments has developed a packaged, ready-to-run parametric test system claiming unrivalled cost-per-pin and total price/performance ratio The Model S470 parametric test system is optimised for production testing of 200mm wafers at the 130nm CMOS node and beyond
This article was originally published on Electronicstalk on 19 Jun 2008 at 8.00am (UK)
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The Model S470 quickly and accurately takes a wide range of I/V and C/V measurements on CMOS, bipolar, and GaAs ICs, including automotive and telecomms ICs, LCDs, and more.
The system's exceptional ease of use increases its overall test value by speeding and simplifying both test programming and day-to-day operation.
The Model S470 design is based on Keithley's production-proven and highly reliable Unix-based Model S400 Series testers (of which hundreds are i